All-Digital Time Integrator Using Bi-Directional Gated Vernier Delay Line
Year: 2020
Type: conference-paper
Source: Conference proceedings
Authors: Parth Parekh, Fei Yuan, Yushi Zhou
Institutions: Toronto Metropolitan University, Lakehead University
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3083172004