Work

Thickness-dependent electronic transport induced by in situ transformation of point defects in MBE-grown Bi2Te3 thin films

Year: 2020

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0025828

Authors: Min Zhang, Wei Liu, Cheng Zhang, Junhao Qiu, Sen Xie, Fuqiang Hua, Yu Cao, Zhi Li, Hongyao Xie, Ctirad Uher, Xinfeng Tang

Institutions: Wuhan University of Technology, State Key Laboratory of Advanced Technology For Materials Synthesis and Processing, Northwestern University, University of Michigan

Language: English

Topic: Advanced Thermoelectric Materials and Devices

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G6893395961, G7426222456

OpenAlex ID: W3092011306

FWCI: 1.681

Cites: 57

Cited by: 30

Related to: 10