Work

Measurement of secondary electron emission yield on the surface of lead silicate glass by time of flight (ToF)

Year: 2020

Type: conference-paper

Source: AOPC 2020: Optical Sensing and Imaging Technology

DOI: 10.1117/12.2579950

Authors: Yonggang Huang, Jinsheng Jia, Yong Sun, Yang Zhang, Peng Jiao, Shanli Wang

Institution: China Building Materials Academy

Language: English

Topic: Photocathodes and Microchannel Plates

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3095257584

FWCI: 0.454

Cites: 5

Cited by: 3

Related to: 10