Charge carrier density noise in graphene: effect of localized/delocalized traps
Work
Year: 2019
Type: article
Authors F. M. D. Pellegrino, G. Falci, E. Paladino
Institutions University of Catania, Istituto Nazionale di Fisica Nucleare, Sezione di Catania, Institute for Microelectronics and Microsystems
Cites: 42
Cited by: 4
Related to: 10
FWCI: 0.406
Citation percentile (by year/subfield): 77.77
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Sustainable Development Goal Affordable and clean energy
Open Access status: closed