Residual stress determination in thin films by X-ray diffraction and the widespread analytical practice applying a biaxial stress model: An outdated oversimplification?
Year: 2020
Type: article
Source: Applied Surface Science
Authors: Peter Schoderböck, Harald Köstenbauer
Institution: Plansee (Austria)
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3107540950