A study on various curvilinear data representations and their impact on mask manufacturing flow
Year: 2021
Type: conference-paper
Source: SPIE Optical Microlithography
DOI: 10.1117/12.2588374
Institution: Siemens (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3132475475
