Work

High Humidity, High Temperature and High Voltage Reverse Bias - A Relevant Test for Industrial Applications

Year: 2018

Type: conference-paper

Authors: Joni Jormanainen, Elena Mengotti, Thiago Batista Soeiro, Enea Bianda, David Baumann, Thomas Friedli, Alexander Heinemann, Aleksi Vulli, J. Ingman

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W3133920682

FWCI: 1.998

Cites:

Cited by: 15

Related to: 10