Work

Time-Gated and Multi-Junction SPADs in Standard 65 nm CMOS Technology

Year: 2021

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2021.3063319

Authors: Wei Jiang, Yamn Chalich, Ryan Scott, M. Jamal Deen

Institution: McMaster University

Language: English

Topic: Advanced Optical Sensing Technologies

Subfield: Instrumentation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: Canada Research Chairs, Natural Sciences and Engineering Research Council of Canada

OpenAlex ID: W3134429164

FWCI: 5.2

Cites: 52

Cited by: 37

Related to: 10