Work

Electron diffraction versus x-ray diffraction--a comparative study of the structure of Ta 2 P

Year: 1998

Type: article

Source: Crystallography Reports

Authors: Thomas E. Weirich, Sven Hovmöller, H. Kalpen, R. Ramlau, Adrian Simon

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3134782008

FWCI: 1.176

Cites:

Cited by: 8

Related to: 9