Work

Scratch detection based on image reconstruction using ideal-image-pair dataset of just before/after defect occurrence

Year: 2021

Type: conference-paper

Source: International Workshop on Advanced Imaging Technology (IWAIT)

DOI: 10.1117/12.2591009

Authors: Hiroki Kobayashi, Ryo Miyoshi, Manabu Hashimoto

Institution: Chukyo University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3135947243

FWCI: 0.366

Cites:

Cited by: 1

Related to: 10