Analysis of two alternative scaling strategies for sub-30 nm Double-Gate SOI MOSFETs
Year: 2006
Type: conference-paper
Authors: N. Barin, M. Braccioli, C. Fiegna, E. Sangiorgi
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3136399682
