Work

Feature Selective Validation Analysis applied to The Measurement of Electronic Circuit Electromagnetic Conducted Emissions - CISPR 25

Year: 2019

Type: conference-paper

Source: SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC)

DOI: 10.1109/imoc43827.2019.9317590

Authors: Marcelo B.Perotoni, Tagleorge M. Silveira, Marcela S. Novo, Kenedy Marconi, Decio Renno, Ednaldo Ferreira, Mateus Andrade, Samuel Marchiori

Institutions: Universidade Federal do ABC, Universidade Federal da Bahia, Instituto Federal da Bahia, Universidade Federal de Itajubá, Serviço Nacional de Aprendizagem Industrial, Universidade SENAI CIMATEC

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3145031663

FWCI:

Cites: 6

Cited by: 1

Related to: 10