Work

Dynamic Hot-Carrier Degradation of Fast-Switching CMOS Inverters with Different Duty Cycles

Year: 1988

Type: conference-paper

Source: European Solid-State Device Research Conference

Authors: Risch, Weber

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3147742471

FWCI:

Cites:

Cited by:

Related to: 10