A Method for Surface Defect Detection of Printed Circuit Board Based on Improved YOLOv4
Year: 2021
Type: conference-paper
Authors: Haofei Xie, Yuan Li, Xingchen Li, Li He
Institution: Chongqing University of Posts and Telecommunications
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3149873124