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セレン化アルミニウム二層薄膜の特性評価【jst・京大機械翻訳】

Year: 2018

Type: conference-paper

Source: AIP conference proceedings

Authors: Boolchandani Sarita, Gyanesh Soni, Srivastava Subodh, Y K Vijay

Language: Japanese

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3175369915

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