Work

A novel degradation model for LED reliability assessment with accelerated stress and self-heating consideration

Year: 2021

Type: conference-paper

Source: IEEE Electronic Components and Technology Conference (ECTC)

DOI: 10.1109/ectc32696.2021.00354

Authors: Minh-Tuan Truong, Laurent Mendizabal, Phuc Do, Benoit Iung

Institutions: CRAN, Université de Lorraine, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Grenoble, Laboratoire d'Électronique des Technologies de l'Information, Université Grenoble Alpes

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3192002193

FWCI: 1.228

Cites: 21

Cited by: 2

Related to: 10