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Atomic Force Microscopy of the Local Electrical Properties of Bilayer Polyaniline-Polystyrene/P(VDF-TrFE) Composite

Year: 2021

Type: article

Abstract: Atomic force microscopy techniques (conductive-AFM, I-V spectroscopy and PFM) were used for characterisation of the local electrical properties of bilayer polyaniline-polystyrene/P(VDF-TrFE) polymer nanocomposite. Observed hysteresis of current-voltage characteristics confirms its memristive properties. It was caused by the influence of the ferroelectric polarization of P(VDF-TrFE) layer, the domain structure of which was visualised by piezoelectric force microscopy on the transport of charge carriers at the interface.

Source: Key engineering materials

DOI: 10.4028/www.scientific.net/kem.899.506

Authors: Artem V. Budaev, Ivanna N. Melnikovich, Vasily E. Melnichenko, Nikita A. Emelianov

Institution: Kursk State University

Language: English

Topic: Dielectric materials and actuators

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: hybrid

OpenAlex ID: W3196575729

FWCI:

Cites: 22

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Related to: 10