Work

Effects of ionizing radiation on breakdown voltage for high voltage offset-gated PMOSFETs

Year: 1993

Type: article

Source: Nuclear Techniques

Authors: Gao Wenyu, Ren Diyuan, Wu Lu, Yan Rongliang, Zhao Yuanfu, Yinbo Li

Institutions: Chinese Academy of Sciences, Academia Sinica, Shanxi Museum

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3200313713

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