Work

Temperature effects on the conducted emission of a high-side switch

Year: 2021

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2021.114262

Authors: N. Baptistat, T. Dubois, K. Abouda, G. Duchamp

Institutions: NXP (France), Laboratoire de l'Intégration du Matériau au Système

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W3206123705

FWCI:

Cites: 9

Cited by: 1

Related to: 10