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Research on an EMC High and Low Voltage Coupling Test Method

Year: 2021

Type: conference-paper

Source: IEEE International Symposium on Electromagnetic Compatibility

DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559237

Authors: Junjie Ma, Zhe Xu, Dengyu Zhang, Haipeng Li

Institution: China Automotive Technology and Research Center

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W3207356249

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