Work

Universal Application of Load Board (L/B) and Socket with Direct Current Tester (DCT) for Various Packages

Year: 2021

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2021p0330

Authors: Yi-Sheng Lin, Yu-Hsiang Hsiao, Pei-Yu Tseng, Yu-Jen Chang, Cheng-Hsin Liu, Yu-Ting Lin

Institution: Advanced Semiconductor Engineering (Taiwan)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W3208345927

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