Work

Temperature Influence on the Electrical Properties of Vertically Stacked Nanowire MOSFETs

Year: 2021

Type: conference-paper

Source: Symposium on Microelectronics Technology and Devices

DOI: 10.1109/sbmicro50945.2021.9585748

Authors: Jaime C. Rodrigues, Genaro Mariniello, Mikael Casse, Sylvain Barraud, Maud Vinet, Olivier Faynot, Marcelo A. Pavanello

Institutions: Centro Universitário FEI, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Grenoble, Laboratoire d'Électronique des Technologies de l'Information

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3208520274

FWCI: 1.188

Cites: 7

Cited by: 3

Related to: 10