Work

Influence of electrode metallization on thin-film transistor performance

Year: 2021

Type: conference-paper

Source: IEEE AFRICON

DOI: 10.1109/africon51333.2021.9570953

Authors: Julia Reker, Thorsten Meyers, Fabio F. Vidor, Trudi-Heleen Joubert, Ulrich Hilleringmann

Institutions: Paderborn University, Universidade Federal do Rio Grande do Sul, University of Pretoria

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Foundation

OpenAlex ID: W3209246720

FWCI: 0.393

Cites: 17

Cited by: 1

Related to: 10