Work

Thickness and birefringence of thin films assessed by interferometry using a low-cost spectrometer

Year: 2021

Type: article

Source: Spectroscopy Letters

DOI: 10.1080/00387010.2021.1991382

Author: Fumiya Nemoto

Institution: National Defense Academy of Japan

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Japan Society for the Promotion of Science

Awards: Friction reduction mechanism by investigating liquid-solid interface, Frustrated monolayer of ionic liquids

OpenAlex ID: W3209508748

FWCI: 0.153

Cites: 35

Cited by: 4

Related to: 10