Work

Measuring refractive index and thickness of transparent thin films using Fresnel diffraction from phase step

Year: 2015

Type: article

Source: انجمن اپتیک و فوتونیک ایران

Authors: Morteza Jafari Siavashani, Mohammad Taghi Tavassoly, Ehsan Ahadi Akhlaghi, Seyed Roohollah Hosseini

Institutions: Institute for Advanced Studies in Basic Sciences, University of Tehran

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W322194397

FWCI: 0.201

Cites:

Cited by: 1

Related to: 10