Work

W/TiN Stacked Gate for ULSI Devices

Year: 1995

Type: conference-paper

Source: SIAM International Conference on Data Mining

Authors: Mahn-Ho Cho, Kyehee Yeom, Duck‐Hyung Lee, Jong-Moon, Tae‐Earn Shim

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W390800237

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