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8aAK-10 2次元光電子回折分光法による半導体ヘテロ接合界面の欠陥準位の検出(8aAK 表面界面構造,領域9(表面・界面,結晶成長))
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Year:
2014
Type:
article
Source:
日本物理学会講演概要集
Authors:
尚行 前島,
文彦 松井,
昌宏 堀田,
公佑 松井,
拓也 大田,
良 石井,
將喜 藤田,
馨 安田,
智裕 松下,
寛 大門
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Language:
Japanese
Topic:
Semiconductor materials and interfaces
Subfield:
Electronic, Optical and Magnetic Materials
Field:
Materials Science
Domain:
Physical Sciences
Open Access status:
closed
OpenAlex ID:
W403854536
FWCI:
Cites:
Cited by:
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