Work

ReliaVision: In-circuit transistor reliability investigation using XML-based technology reliability information in PDKs

Year: 2021

Type: conference-paper

Abstract: To verify the reliability of integrated circuits before manufacturing and testing, aging simulations can assess the impact of transistor degradation mechanisms on circuit performance. Although available in design environments, they still appear uncommon in circuit design projects. One major problem, from our experience, is the simulation effort that aggravates the problem of mastering verification. We present ReliaVision, an approach to overcome this issue by enabling an in-circuit investigation of transistor reliability based on transient stress simulations of mission profiles and demonstrate it based on an example. We particularly address the task of providing transistor reliability information in process design kits in a machine readable form by using XML syntax.

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/iirw53245.2021.9635606

Authors: Lukas Hahne, G. Fabio A. Velarde, Andre Lange, Christoph Sohrmann, Daniel Wetzel, Sonja Crocoll

Institutions: Fraunhofer Institute for Integrated Circuits IIS, Division Engineering of Adaptive Systems EAS, X-Fab (Germany)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: green

OpenAlex ID: W4200412397

FWCI: 0.771

Cites: 4

Cited by: 3

Related to: 10