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A Comparative Study of Short Channel Effects in 3-D FinFET with High-K Gate Di-electric

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Year: 2021
Type: conference-paper
Source: International Conference in Advances in Power, Signal, and Information Technology (APSIT)
DOI: 10.1109/apsit52773.2021.9641388
Authors: Rao Muhammad Asif, Saif Ur Rehman, Ateeq Ur Rehman, Mohit Bajaj, Subhashree Choudhury, T.P. Dash
Institutions: Superior University, Government College University, Lahore, National Institute of Technology Delhi, Siksha O Anusandhan University
Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed
OpenAlex ID: W4200529175
FWCI: 0.771
Cites: 20
Cited by: 6
Related to: 10
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