Work

High Precision Measurement of Sub-Nano Ampere Current in ATE Environment

Year: 2021

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats52891.2021.00036

Authors: Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Gaku Ogihara, Daisuke Iimori, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi

Institutions: ROHM, Gunma University

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4206512263

FWCI: 0.387

Cites: 2

Cited by: 1

Related to: 10