Work

Laser scanning confocal microscopy observations of InAsSb thin and thick epilayers

Year: 2022

Type: conference-paper

Source: Asia Pacific Conference on Optics Manufacture and International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM)

DOI: 10.1117/12.2611065

Authors: Yuzhu Gao, Xiuying Gong, Zuntian Chen, Minoru Niigaki, Tadanobu Koyama, Yasuhiro Hayakawa

Institutions: Tongji University, Hamamatsu Photonics (Japan), Shizuoka University

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4213072142

FWCI:

Cites: 12

Cited by:

Related to: 10