Work

Investigation of orientation, surface morphology, impurity concentration and reflectivity of the multi-crystalline silicon wafers

Year: 2022

Type: article

Source: Materials Chemistry and Physics

DOI: 10.1016/j.matchemphys.2022.125932

Authors: Sivaraj Durairaj, V. Kesavan, T. Keerthivasan, M. Avinash Kumar, M. Srinivasan, P. Ramasamy

Institutions: Sri Sivasubramaniya Nadar College of Engineering, St. Joseph's College

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4214535893

FWCI: 0.477

Cites: 31

Cited by: 7

Related to: 10