Work

The application of experimental design to the analysis of semiconductor manufacturing lines

Year: 2002

Type: conference-paper

Source: Winter Simulation Conference

DOI: 10.1109/wsc.1990.129531

Authors: S.J. Hood, P.D. Welch

Institution: IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Simulation Techniques and Applications

Subfield: Management Science and Operations Research

Field: Decision Sciences

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4235989395

FWCI: 0.87

Cites: 5

Cited by: 8

Related to: 10