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A Coupled Simulation and Optimization Approach to Nanodevice Fabrication with Minimization of Electrical Characteristics Fluctuation

Year: 2006

Type: conference-paper

Source: IEEE Conference on Nanotechnology (IEEE NANO)

DOI: 10.1109/nano.2006.1717004

Authors: Yiming Li, Shao-Ming Yu, Cheng-Kai Chen

Institution: National Yang Ming Chiao Tung University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4239364989

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