Work

Integrating VISA, IVI and ATeasy to migrate legacy test systems

Year: 2005

Type: conference-paper

Source: IEEE AUTOTESTCON (IEEE Systems Readiness Technology Conference)

DOI: 10.1109/autest.2004.1436775

Author: Loofie Gutterman

Language: English

Topic: Engineering and Test Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4239698188

FWCI: 0.544

Cites:

Cited by: 3

Related to: 10