Work

Combined DVFS and mapping exploration for lifetime and soft-error susceptibility improvement in MPSoCs

Year: 2014

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.7873/date.2014.074

Authors: A. Das, A. Kumar, B. Veeravalli, C. Bolchini, A. Miele

Institutions: National University of Singapore, Politecnico di Milano

Language: English

Topic: Embedded Systems Design Techniques

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4242767112

FWCI: 1.312

Cites:

Cited by: 23

Related to: 10