Electrical Characterization of Semiconductor Materials and Devices
Year: 2017
Type: book-chapter
Source: Springer handbooks
Authors: M. Jamal Deen, Fabien Pascal
Institutions: McMaster University, Université de Montpellier
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4252299010
