Year: 2022
Type: preprint
Abstract: This paper studies the dependability of the Xilinx Deep-Learning Processing Unit (DPU) under neutron irradiation. It analyses the impact of Single Event Effects (SEEs) on the accuracy of the DPU running the resnet50 model on a Xilinx Ultrascale+ MPSoC.
Source: arXiv (Cornell University)
Institutions: University of Piraeus, ISIS Neutron and Muon Source
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
Award: G7845815574
OpenAlex ID: W4282012808
