Defect‐induced current coupling in multi‐junction solar cells revealed by absolute electroluminescence imaging
Year: 2022
Type: article
DOI: 10.1002/pip.3601
Authors: Youyang Wang, Liying Li, Yun Jia, Xiaobo Hu, Guoen Weng, Xianjia Luo, Shaoqiang Chen, Ziqiang Zhu, Junhao Chu, Hidefumi Akiyama
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4283156366
