Work

Influence of X-ray Source Spectrum on TID Degradation of CMOS Devices

Year: 2022

Type: conference-paper

Source: Moscow Workshop on Electronic and Networking Technologies (MWENT)

DOI: 10.1109/mwent55238.2022.9802295

Authors: A. O. Teplyakova, A. Yu. Egorov, V. D. Kalashnikov, A. V. Ulanova, V. A. Marfin, M. A. Rogovaia

Institution: National Research Nuclear University MEPhI

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4283464076

FWCI:

Cites: 13

Cited by: 1

Related to: 10