Work

Exploring the Impact of Parametric Variability on Eye Diagram of On-Chip Multi-walled Carbon Nanotube Interconnects using Fast Machine Learning Techniques

Year: 2022

Type: conference-paper

Source: IEEE Electronic Components and Technology Conference (ECTC)

DOI: 10.1109/ectc51906.2022.00160

Authors: Km Dimple, Surila Guglani, Rahul Kumar, Sourajeet Roy, Brajesh Kumar Kaushik, Suyash Kushwaha, Rohit Sharma

Institutions: Indian Institute of Technology Roorkee, Indian Institute of Technology Ropar

Language: English

Topic: Interconnection Networks and Systems

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4285103256

FWCI: 1.564

Cites: 21

Cited by: 9

Related to: 10