Work

SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging

Year: 2022

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927622001039

Authors: Jean-Nicolas Audinot, Alexander D Ost, Charlotte Stoffels, Patrick Philipp, Olivier De Castro, Antje Biesemeier, Quang Hung Hoang, Tom Wirtz

Institutions: Luxembourg Institute of Science and Technology, University of Luxembourg

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4286461981

FWCI: 0.242

Cites: 7

Cited by: 3

Related to: 10