Work

Scanning Transmission Helium Ion Microscopy- How Does It Compare to TEM?

Year: 2022

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927622001040

Authors: Annalena Wolff, Rebecca Fieth

Institutions: California Institute of Technology, Queensland University of Technology, Kavli Nanoscience Institute

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: General Materials Science

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4286462385

FWCI:

Cites: 3

Cited by:

Related to: 10