Work

Accurate and Fast STT-MRAM Endurance Evaluation Using a Novel Metric for Asymmetric Bipolar Stress and Deep Learning

Year: 2022

Type: conference-paper

Source: IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

DOI: 10.1109/vlsitechnologyandcir46769.2022.9830351

Authors: Z. Wei, W. Kim, Z. Wang, L. Hu, D. Jung, J. Zhang, Y. Huai

Language: English

Topic: Magnetic properties of thin films

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4286571908

FWCI: 2.221

Cites: 3

Cited by: 5

Related to: 10