Work

Predicting Lifetime of Semiconductor Power Devices Under Power Cycling Stress Using Artificial Neural Network

Year: 2022

Type: article

Source: IEEE Journal of Emerging and Selected Topics in Power Electronics

DOI: 10.1109/jestpe.2022.3194189

Authors: Alessandro Vaccaro, Paolo Magnone, Andrea Zilio, Paolo Mattavelli

Institution: University of Padua

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4288064554

FWCI: 1.071

Cites: 46

Cited by: 21

Related to: 10