Work

Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation

Year: 2018

Type: article

Source: ACM SIGMETRICS Performance Evaluation Review

DOI: 10.1145/3292040.3219659

Authors: Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu

Institutions: Carnegie Mellon University, Seagate (United States), ETH Zurich

Language: English

Topic: Advanced Data Storage Technologies

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Seagate Technology

OpenAlex ID: W4288629930

FWCI: 0.446

Cites: 1

Cited by: 8

Related to: 10