Work

PWM power cycling test for IGBT modules operating at ambient temperature

Year: 2012

Type: conference-paper

Source: HAL

Authors: Tounsi, Mohamed, Oukaour, Amrane, Tala-Ighil, Boubekeur, Pouderoux, B., Boudart, B., Aissani, Djamil

Institutions: University of Béjaïa, Laboratoire Universitaire des Sciences Appliquées de Cherbourg

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4291986176

FWCI:

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Related to: 10