Multistate time lag dynamic Bayesian networks model for reliability prediction of smart meters
Year: 2022
Type: article
Source: Microelectronics Reliability
Authors: Kaixin Liu, Jia Qi, Zhen Zhou, Yongquan Sun, Kangkang Guo
Institution: Harbin University of Science and Technology
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4297200745