Work

Mechanism of HfO2-FeFET Memory Operation Revealed by Quantitative Analysis of Spontaneous Polarization and Trap Charge

Year: 2022

Type: conference-paper

Source: IEEE Silicon Nanoelectronics Workshop

DOI: 10.1109/snw56633.2022.9889039

Authors: Reika Ichihara, Yusuke Higashi, Kunifumi Suzuki, Haruka Kusai, Yoko Yoshimura, Takamasa Hamai, Yuta Kamiya, Kota Takahashi, Kazuhiro Matsuo, Yasushi Nakasaki, Hidenori Miyagawa, Masamichi Suzuki, Kiwamu Sakuma, Yuuichi Kamimuta, Masumi Saitoh

Institution: KIOXIA Corporation (Japan)

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4312379599

FWCI: 0.777

Cites: 3

Cited by: 2

Related to: 10