Work

A Methodology for Identifying Critical Sequential Circuits with Graph Convolutional Networks

Year: 2022

Type: conference-paper

Source: IEEE Computer Society Annual Symposium on VLSI

DOI: 10.1109/isvlsi54635.2022.00017

Authors: Li Lu, Junchao Chen, Markus Ulbricht, Milos Krstic

Institution: Leibniz Institute for High Performance Microelectronics

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Bundesministerium für Bildung und Forschung

Award: Verbundprojekt: Entwicklungsplattform und Ökosystem für skalierbare Spezialprozessoren im Edge-Computing - Scale4Edge-, Teilvorhaben: Hochzuverlässige RISC-V-Prozessoren

OpenAlex ID: W4312878747

FWCI: 2.72

Cites: 22

Cited by: 9

Related to: 10